Built-In-Self-Test (BIST) or Built-In-Test (BIT) is a capability of an Integrated Circuit (IC) to test itself. Such additional hardware and software features are incorporated into ICs that can conduct a self test for their functionality and optimality. It makes the circuit testing easier, reliable and less costly.
A BIST unit has three components – Test Pattern Generator (TPG), Circuit Under Test (CUT) and Output Response Analyzer (ORA).
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